The Model 590 Tripod Polisher® was designed to accurately prepare TEM and
SEM samples of pre-specified, micron-sized regions. For TEM samples, this
technique has been used successfully to limit ion milling times to less
than 15 minutes and, in some cases, has eliminated the need for ion milling.
Although this technique was designed for preparing semiconductor cross-sections,
it has been used to prepare both plan-view and cross-section samples from
such diverse materials as ceramics, composites, metals, and geological samples.
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